CASS Outreach Round One: Correlated Double Sampling (CDS) for Solid-State Image Sensors

Hello again! The IEEE Columbus Joint Chapter of the Solid-State Circuits and Circuits and Systems Societies is back with an exciting series of lectures given by distinguished lecturers. The next lecture in this series will be on Correlated Double Sampling (CDS) for Solid-State Image Sensors by Prof. Marvin H. White from the Ohio State University. This talk will be fully catered and will include around an hour of lecture as well as an additional hour for questions, discussion, and networking. See below for more details on registration, the lecture topic, and the distinguished speaker. Additionally, be sure to click the web version of this notice for the full event flyer. Speaker(s): Marv, Agenda: Short Introduction (5 min) Technical Talk (60 minutes) Questions (10 minutes) Refreshments and Social (30-60 minutes) Room: 200, Bldg: Rev1 Ventures, 1275 Kinnear Rd, Columbus, Ohio, United States, 43212, Virtual: https://events.vtools.ieee.org/m/364668