Making sure your IC works when you buy it: Integrated Circuit Testing and the International Test Conference Testing integrated circuits and systems for defects has never been trivial. Exhaustive testing is impossible, and test economics require testing to be fast and effective. This talk will discuss some of the work that engineers have done over the years to help minimize test escapes and reduce the odds that customers end up with defective devices. It will then cover some of the issues at the cutting edge of test today, and why they get so much attention at the International Test Conference. Speaker(s): Jennifer Dworak Agenda: WEBINAR: 7:00 - 8:00 P.M. The Zoom Webinar link and password will be forwarded to all registered participants after Noon on the day of the meeting. Check your spam folder if you don't see the email. Webinar is open to all. PDH certificates are available and an evaluation form will be emailed to you after the meeting. PDH certificate are sent by IEEE USA 3-4 weeks after the meeting. Virtual: https://events.vtools.ieee.org/m/453863

Making sure your IC works when you buy it: Integrated Circuit Testing and the International Test Conference Testing integrated circuits and systems for defects has never been trivial. Exhaustive testing is impossible, and test economics require testing to be fast and effective. This talk will discuss some of the work that engineers have done over the years to help minimize test escapes and reduce the odds that customers end up with defective devices. It will then cover some of the issues at the cutting edge of test today, and why they get so much attention at the International Test Conference. Speaker(s): Jennifer Dworak Agenda: WEBINAR: 7:00 - 8:00 P.M. The Zoom Webinar link and password will be forwarded to all registered participants after Noon on the day of the meeting. Check your spam folder if you don't see the email. Webinar is open to all. PDH certificates are available and an evaluation form will be emailed to you after the meeting. PDH certificate are sent by IEEE USA 3-4 weeks after the meeting. Virtual: https://events.vtools.ieee.org/m/453863

Dr Yuhong Liu, 2025 IEEE Chair of Computer Society Geographic Activities Committee, will lead the Spring Sessions of “Careers in Technology” with a discussion of her career preparation and a deep dive into her own keen interests and vast experience in research including trustworthy computing and cyber security of emerging applications, such as Internet-of-things, blockchain, and online social media. She has published over 90 papers in prestigious journals and peer-reviewed conferences. Her papers have been selected as the best paper at the IEEE International Conference on Social Computing 2010. Speaker(s): Yuhong Liu, PhD Virtual: https://events.vtools.ieee.org/m/456307

Dr Yuhong Liu, 2025 IEEE Chair of Computer Society Geographic Activities Committee, will lead the Spring Sessions of “Careers in Technology” with a discussion of her career preparation and a deep dive into her own keen interests and vast experience in research including trustworthy computing and cyber security of emerging applications, such as Internet-of-things, blockchain, and online social media. She has published over 90 papers in prestigious journals and peer-reviewed conferences. Her papers have been selected as the best paper at the IEEE International Conference on Social Computing 2010. Speaker(s): Yuhong Liu, PhD Virtual: https://events.vtools.ieee.org/m/456307

R2 Region Director - New RD, New Vision IEEE History Center Presentation Introduction to 2025 Region 2 RVC Vitality Stats & Update (Brief) Agenda: R2 Region Director - New RD, New Vision IEEE History Center Presentation Vitality Stats & Update (Brief) Virtual: https://events.vtools.ieee.org/m/446652