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2nd High Fidelity RF Modeling and Simulation Workshop
June 8, 2022 @ 08:00 - 17:00
The second edition of the High-Fidelity RF Modeling and Simulation Workshop will cover a wide range of topics related to state-of-the-art modeling of RF clutter and targets along with a real-time demonstration of RF modeling and simulation (M&S) tools. With increasing developmental flight testing and the shortage of representative data sets, it is critical to develop and use high-fidelity site-specific M&S tools to undertake a performance assessment of candidate radar signal processing algorithms in a representative environment. The tools discussed in the workshop can be used to model various scenarios like SAR, GMTI, and communications. As part of the inaugural edition of the workshop held in 2020, challenge datasets were distributed to the community. In this year’s workshop, several users will present their results using the aforementioned datasets as well as the M&S tools. A wide array of RF applications will be covered during this workshop. Please join us to learn and discuss the latest advances in the field of high-fidelity site-specific RF M&S. All workshop discussions will be Distribution A (Approved for public release with unlimited distribution). There is no cost for attending the workshop. Interested participants are requested to email the Technical Co-Chairs to receive the meeting zoom link. – Dr. Sandeep Gogineni sgogineni@islinc.com – Dr. Bosung Kang Bosung.Kang@udri.udayton.edu https://www.wright.edu/autonomy-technology-research-center/events Co-sponsored by: Autonomy Technology Research (ATR) Center Summer Program Agenda: TOPICS COVERED: – Cognitive Fully Adaptive Radar (CoFAR) and the need for high-fidelity M&S tools – Recent advances in site-specific RF clutter (land and ocean) models and their comparison with traditional approximate statistical models – Application of the state-of-the-art M&S tools for RF applications – User presentations on previously distributed challenge radar datasets – New challenge datasets Virtual: https://events.vtools.ieee.org/m/315230