IEEE Dayton Section

Real live jamming trials allowed studying the in-channel RF-interference susceptibility of GNSS navigation capabilities in airborne aircraft. While emitting from a ground-based jammer on the L1-C/A frequency, all trial aircraft flew an approach like trajectory on an elevated mountain plateau in Switzerland. Rotary/fixed wing and civil/military aircraft had a chance to investigate their performance in a realistic jamming scenario. All aircraft had to carry recording equipment. This allowed an analysis of aircraft data, ranging from receiver C/No to flight management data. Motivation, experimental set-up, performance assessment and showstoppers are elaborated. Speaker(s): Professor Wipf, Agenda: May 09, 2023 11:30 A.M.-12:30 P.M. - Seminar By Professor Heinz Wipf Tec^Edge, 5000 Springfield Pike, Ste 100, Dayton, Ohio, United States, 45431

Materials characterization and analysis is the driving force for advancing technological capabilities. Sample preparation for materials characterization and analysis is critical to gain a better understanding of a materials microstructure. Understanding the structure helps reveal physical and chemical properties, and offers an insight into how materials are processed. All three are inter-connected with a change in one resulting in changes in the others. Materials analysis occurs from the macroscopic down to the atomistic level. The amount of time needed for sample preparation is critical and dependent on the specific technique used to prepare specimens. The gallium-based focused ion beam (FIB) was designed to be a circuit editor but was quickly adapted to prepare specimens for TEM. It was also used for serial slice and view of bulk materials, albeit on an area-limited microscopic scale. The gallium ion beam also introduced artifacts when working on aluminum & gallium-based materials and microelectronics. The xenon (Xe) plasma FIB (PFIB) was introduced a~2012 and has opened a larger-scale application space not attainable with the gallium-beam FIB. Using xenon as the primary ionic species allows for much higher beam currents reducing specimen preparation times. Xenon also prevents gallium-beam contamination and artifacts in aluminum & gallium-based materials and microelectronics research. The newest generation of PFIBS offers a multi-plasma source selectable with not just xenon, but the ability to choose argon, nitrogen or oxygen as the plasma source. Each plasma ionic species has unique materials applications for ‘soft-materials’ such as biological tissue and polymers, for example. The application space is wide-open at with the full potential of this new generation PFIB yet to be seen. This proposal outlines the need for the HYDRA PFIB, the impact it will have on the study of ultra-high temperature materials and microelectronics, and how it enable materials research from the macroscopic to the atomic levels. Co-sponsored by: Wright-Patt Multi-Intelligence Development Consortium (WPMDC), The DOD & DOE Communities Speaker(s): , Tim Agenda: Materials characterization and analysis is the driving force for advancing technological capabilities. Sample preparation for materials characterization and analysis is critical to gain a better understanding of a materials microstructure. Understanding the structure helps reveal physical and chemical properties, and offers an insight into how materials are processed. All three are inter-connected with a change in one resulting in changes in the others. Materials analysis occurs from the macroscopic down to the atomistic level. The amount of time needed for sample preparation is critical and dependent on the specific technique used to prepare specimens. The gallium-based focused ion beam (FIB) was designed to be a circuit editor but was quickly adapted to prepare specimens for TEM. It was also used for serial slice and view of bulk materials, albeit on an area-limited microscopic scale. The gallium ion beam also introduced artifacts when working on aluminum & gallium-based materials and microelectronics. The xenon (Xe) plasma FIB (PFIB) was introduced a~2012 and has opened a larger-scale application space not attainable with the gallium-beam FIB. Using xenon as the primary ionic species allows for much higher beam currents reducing specimen preparation times. Xenon also prevents gallium-beam contamination and artifacts in aluminum & gallium-based materials and microelectronics research. The newest generation of PFIBS offers a multi-plasma source selectable with not just xenon, but the ability to choose argon, nitrogen or oxygen as the plasma source. Each plasma ionic species has unique materials applications for ‘soft-materials’ such as biological tissue and polymers, for example. The application space is wide-open at with the full potential of this new generation PFIB yet to be seen. This proposal outlines the need for the HYDRA PFIB, the impact it will have on the study of ultra-high temperature materials and microelectronics, and how it enable materials research from the macroscopic to the atomic levels. Virtual: https://events.vtools.ieee.org/m/361497

Please join IEEE Women in Engineering (WIE) and Young Professionals (YP) at our next social event! We will be meeting for brunch at Sunrise Cafe in Yellow Springs. Food and drinks will be on your own (not provided by IEEE). We will be having some raffles at the event so make sure you don't miss it! You must be present to win! Bring a guest and have a good time! We hope to have our group on the patio. If the weather does not allow this, we will have tables reserved inside. You can check out the menu here: https://www.sunrisecafe.net/ Agenda: 11:00am Brunch (not provided by IEEE) 12:00pm Raffles 259 Xenia Avenue, Yellow Springs, Ohio, United States, 45387