IEEE Philadelphia Section


International Test Conference

Tuesday, November 12 – Thursday, November 14, 2019

Marriott Washington Wardman Park Hotel
Building 661 NW Corner of 12th St. and Kitty Hawk Ave
Philadelphia, PA 191212.

The world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.


Information and Registration